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Effects of crystallinity and impurities on the electrical conductivity of Li-La-Zr-O thin films

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journal contribution
posted on 30.10.2015 by J. Sun Park, L. Cheng, V. Zorba, A. Mehta, J. Cabana, G. Chen
We present a study of the fabrication of thin films from a Li7La3Zr2O12 (LLZO) target using pulsed laser deposition. The effects of substrate temperatures and impurities on electrochemical properties of the films were investigated. The thin films of Li-La-Zr-O were deposited at room temperature and higher temperatures on a variety of substrates. Deposition above 600 °C resulted in a mixture of cubic and tetragonal phases of LLZO, as well as a La2Zr2O7 impurity, and resulted in aluminum enrichment at the surface when Al- containing substrates were used. Films deposited at 600 °C exhibited the highest room temperature conductivity, 1.61×10-6 S/cm. The chemical stability toward metallic lithium was also studied using X-ray photoelectron spectroscopy, which showed that the oxidation state of zirconium remained at +4 following physical contact with heated lithium metal.




This work was supported by the Assistant Secretary for Energy Efficiency and Renewable Energy, Office of Vehicle Technologies and the Chemical Sciences, Geosciences, and Biosciences Division, Office of Basic Energy Sciences of the U.S. Department of Energy under contract no. DE-AC02-05CH11231. A portion of this work was done at Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, which is supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under Contract No. DE-AC02-76SF00515.


Publisher Statement

This is the author's version of a work that was accepted for publication in Thin Solid Films. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definative version wass subsequently published in Thin Solid Films, 2015. 576: 55-60. DOI:10.1016/j.tsf.2014.11.019.





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