JialinLi2019_IEEEAccess.pdf (8.28 MB)

A Directed Acyclic Graph Network Combined With CNN and LSTM for Remaining Useful Life Prediction

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journal contribution
posted on 16.08.2021, 16:40 by J Li, X Li, David HeDavid He
Accurate and timely prediction of remaining useful life (RUL) of a machine enables the machine to have an appropriate operation and maintenance decision. Data-driven RUL prediction methods are more attractive to researchers because they can be deployed quicker and cheaper compared to other approaches. The existing deep neural network (DNN) models proposed for the applications of RUL prediction are mostly single-path and top-down propagation. In order to improve the prognostic accuracy of the network, this paper proposes a directed acyclic graph (DAG) network that combines long short term memory (LSTM) and a convolutional neural network (CNN) to predict the RUL. Different from the existing prediction models combined with CNN and LSTM, the method proposed in this paper combines CNN and LSTM organically instead of just using CNN for feature extraction. Moreover, when a single timestamp is used as an input, padding the signals in the same training batch would affect the prediction ability of the developed model. To overcome this drawback, the proposed method generates a short-term sequence by sliding the time window (TW) with one step size. In addition, based on the degradation mechanism, the piece-wise RUL function is used instead of the traditional linear function. In the experimental test, the turbofan engine degradation simulation dataset provided by NASA is used to validate the proposed RUL prediction model. By comparing with the existing methods using the same dataset, it can be concluded that the prediction method proposed in this paper has better prediction capability.



Li, J., Li, X.He, D. (2019). A Directed Acyclic Graph Network Combined With CNN and LSTM for Remaining Useful Life Prediction. IEEE Access, 7, 75464-75475. https://doi.org/10.1109/ACCESS.2019.2919566


Institute of Electrical and Electronics Engineers (IEEE)



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