University of Illinois Chicago
Browse

Currents on Conducting Surfaces of a Semielliptical-Channel-Backed Slotted Screen in an Isorefractive Environment

Download (277.52 kB)
journal contribution
posted on 2014-02-03, 00:00 authored by Danilo Erricolo, Michael D. Lockard, Chalmers M. Butler, Piergiorgio L.E. Uslenghi
Electromagnetic penetration through an aperture into a cavity is considered. The structure of interest is a semielliptical channel flush mounted under a metal plane and slotted along the interfocal distance of its cross-section. The channel is filled with a material isorefractive to the medium that occupies the half-space above the metal plane. Three independent integral equations are developed to compute the currents induced on the structure of interest by plane wave and line source excitations. Numerical results from the integral equation methods are compared with the evaluation of the analytical expressions, derived in a previous paper, that involve the summation of Mathieu functions. Data are presented for two polarizations, various values of intrinsic impedances and ratio between aperture width and incident radiation wavelength. Further data are presented for the bistatic radar cross-section of the structure of interest. All data obtained from the integral equation methods and the evaluations of the analytical formulas are in excellent agreement.

Funding

This work was supported in part by the U.S. Department of Defense under MURI Grant F49620-01-1-0436, in part by the US Air Force Office of Scientific Research under DURIP Grant F49620-02-1-0440, and in part by a grant of computer time from the DOD High Performance Computing Modernization Program at ASC.

History

Publisher Statement

© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.

Publisher

Institute of Electrical and Electronics Engineers

Language

  • en_US

issn

0018-926X

Issue date

2005-07-01

Usage metrics

    Categories

    No categories selected

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC