journal contribution
posted on 2017-01-16, 00:00 authored by P.J. Phillips, H. Iddir, D.P. Abraham, R.F. Klie This study focuses on the effects of electron beam induced irradiation to the layered oxide
Li2MnO3. Aberration-corrected scanning transmission electron microscopy and electron energy
loss spectroscopy are used to characterize structural and electronic transitions in the material during
irradiation, with a focus on changes in Mn valence and O content. This truly in situ irradiation
allows for specific particle tracking, dose quantification, and real-time observation, while
demonstrating many parallels to the oxide’s structure evolution observed during electrochemical
cycling. Furthermore, it is demonstrated that typical imaging conditions are not severe enough
to induce damage to the pristine oxide.
Funding
The authors acknowledge K.-B. Low and A. Nicholls of
the UIC Research Resources Center, J. Bareno and R.
Benedek at Argonne National Laboratory, and J.-C. Idrobo
at Oak Ridge National Laboratory. Some of the
computational work was conducted as part of the Applied
Battery Research Program of the Office of Vehicle
Technologies, U.S. Department of Energy, while computer
time allocations at the Fusion Computer Facility, Argonne
National Laboratory, and at EMSL Pacific Northwest
National Laboratory are gratefully acknowledged. P.J.P. and
R.F.K. acknowledge financial support from the Joint Center
for Energy Storage Research (JCESR), an Energy Innovation
Hub funded by the U.S. Department of Energy (DOE),
Office of Science, Basic Energy Sciences. The UIC JEOL
JEM-ARM 200CF is supported by an MRI-R2 grant from the
National Science Foundation (Grant No. DMR-0959470)
History
Publisher Statement
This is a copy of an article published in the Applied Physics Letters © 2014 American Institute of Physics Publications. This article may be download for personal use only. Any other use require prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters 105, 113905 (2014); doi: 10.1063/1.4896264 and may be found at
http://dx.doi.org/10.1063/1.4896264Publisher
American Institute of Physicsissn
0003-6951Issue date
2014-01-01