The capability to tailor the dispersion and the cutoff frequency of waveguides is of importance, as these essential parameters govern the operating frequency range and the waveguide dimension. Here, we propose the concept of substrate-integrated impedance surface (SIIS) that enables arbitrary control of propagation characteristics of closed-shape waveguides. Specifically, we develop a theoretical framework for the simplest form of SIIS constituted by a one-dimensional array of blind vias, which is equivalent to a homogenized surface capacitance embedded in the waveguide. We theoretically and experimentally demonstrate that loading a substrate-integrated waveguide (SIW) with a capacitive SIIS can effectively reduce its cutoff frequency, regardless of the transverse dimension of the SIW. In addition, a SIIS-loaded SIW exhibits several intriguing phenomena, such as the slow-wave guiding properties and the local field concentration. This SIIS-loading technique may open up new possibilities for miniaturization of various waveguide-based components and for enhancement of their uses in microwave sensing and nonlinear functions.
Funding
This work is supported by the National Natural Science Foundation of China 61771280. (Corresponding author: Yue Li). PYC and HB would like to thank KAUST CRG-2953 Grant for supporting the research reported in this publication.
History
Publisher Statement
Copyright @ American Physical Society
Citation
He, Y., Li, Y., Zhu, L., Bagci, H., Erricolo, D., & Chen, P. (2018). Waveguide Dispersion Tailoring by Using Embedded Impedance Surfaces. Physical Review Applied, 10(6). doi:10.1103/PhysRevApplied.10.064024