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Atomic scale analysis of semiconductor quantum dots by scanning transmission electron microscopy.

thesis

posted on 2014-03-17, 00:00 authored by Yuanyuan. Lei

Atomic scale analysis of semiconductor quantum dots by scanning transmission electron microscopy.

History

Degree Grantor

University of Illinois at Chicago.

Degree Level

Doctoral

Language

en

Issue date

2003-01-01

File(s) available to UIC only. Log in with UIC Net ID to access:

https://uic.figshare.com/account/projects/71123/articles/10814414

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Keywords

Physics, Condensed Matter.

Licence

Exports