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Atomic scale analysis of semiconductor quantum dots by scanning transmission electron microscopy.

thesis
posted on 17.03.2014, 00:00 by Yuanyuan. Lei
Atomic scale analysis of semiconductor quantum dots by scanning transmission electron microscopy.

History

Degree Grantor

University of Illinois at Chicago.

Degree Level

Doctoral

Language

en

Issue date

01/01/2003

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Categories

Keywords

Physics, Condensed Matter.

Licence

In Copyright

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