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Atomic scale analysis of semiconductor quantum dots by scanning transmission electron microscopy.

thesis
posted on 17.03.2014, 00:00 authored by Yuanyuan. Lei
Atomic scale analysis of semiconductor quantum dots by scanning transmission electron microscopy.

History

Degree Grantor

University of Illinois at Chicago.

Degree Level

Doctoral

Language

en

Issue date

01/01/2003

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Categories

Keywords

Physics, Condensed Matter.

Licence

In Copyright

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