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In-situ ellipsometry monitoring of MBE grown cadmium zinc telluride(211)boron/silicon(211) and cadmium telluride(211)boron/silicon(211) structures.
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posted on 2014-03-17, 00:00 authored by Mikhail. DaraseliaIn-situ ellipsometry monitoring of MBE grown cadmium zinc telluride(211)boron/silicon(211) and cadmium telluride(211)boron/silicon(211) structures.
History
Degree Grantor
University of Illinois at Chicago.Degree Level
- Doctoral
Language
- en
Issue date
2002-01-01File(s) available to UIC only. Log in with UIC Net ID to access:
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