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Power and Energy Efficient Error Detection Techniques

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posted on 28.06.2013, 00:00 authored by Yu Liu
Over the past decades significant technological progress has been made in Very Deep Sub-Micron and nanometer technology domains. However, the performance improvement due to shrinking size of transistors has come at the cost of decreased reliability. Our research mainly studies power and energy efficient error detection techniques at circuit and system levels. The security concern of the scan-based Design-for-Test is also studied.

History

Advisor

Wu, Kaijie

Department

Electrical and Computer Engineering

Degree Grantor

University of Illinois at Chicago

Degree Level

Doctoral

Committee Member

Khokhar, Ashfaq Zhu, Zhichun Lillis, John Chowdhury, Masud

Submitted date

2013-05

Language

en

Issue date

28/06/2013

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